DocumentCode :
230583
Title :
Improved field emitter arrays with high-aspect-ratio current limiters and self-aligned gates
Author :
Guerrera, Stephen A. ; Akinwande, Akintunde Ibitayo
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Massachusetts Inst. of Technol., Cambridge, MA, USA
fYear :
2014
fDate :
6-10 July 2014
Firstpage :
25
Lastpage :
26
Abstract :
We report an updated device structure and fabrication process for the creation of silicon field emitter arrays with integrated silicon vertical current limiters for applications that require high performance cold cathode electron sources. The improved device includes thicker dielectric films to prevent dielectric breakdown and leakage current from the gate electrode to the substrate, and metalized probe pads to reduce electron interception by the gate electrode.
Keywords :
cathodes; electric breakdown; elemental semiconductors; field emitter arrays; leakage currents; microfabrication; silicon; Si; cold cathode electron sources; dielectric breakdown; dielectric films; electron interception; field emitter arrays; gate electrode to; high-aspect-ratio current limiters; leakage current; metalized probe pads; self-aligned gates; silicon vertical current limiters; Anodes; Current limiters; Field emitter arrays; Logic gates; Silicon; Surface morphology; FEA; Silicon field emitter arrays; field emission; self-aligned gate; vertical current limiter;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Nanoelectronics Conference (IVNC), 2014 27th International
Conference_Location :
Engelberg
Print_ISBN :
978-1-4799-5306-6
Type :
conf
DOI :
10.1109/IVNC.2014.6894742
Filename :
6894742
Link To Document :
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