In-situ measurement of temperature dependence of emission current and pressure of a fully-sealed ZnO nanowire field emission device

In order to evaluate the performance of ZnO nanowire field emission display under different temperature, the temperature dependence of field emission current of a fully-sealed diode-structured field emission device using ZnO nanowire cold cathode was studied when the temperature changed from -60°C to 80°C. The pressure inside the device was also measured. It is found that the emission current decreases with increasing temperature, which is attributed to the increasing pressure. The findings are crucial to optimize the manufacture process of the FED using ZnO nanowire cold cathode.