DocumentCode :
2306165
Title :
Metrics, techniques and recent developments in mixed-signal testing
Author :
Roberts, G.W.
Author_Institution :
Microelectron. & Comput. Syst. Lab., McGill Univ., Montreal, Que., Canada
fYear :
1996
fDate :
10-14 Nov. 1996
Firstpage :
514
Lastpage :
521
Abstract :
This paper presents a tutorial on mixed-signal testing. Our focus is on testing the analog portion of the mixed-signal device, as the digital portion is handled in the usual way. We begin by first outlining the role of test in a manufacturing environment, and its impact on product cost and quality. We look at the impact of manufacturing defects on the behavior of digital and analog circuits. Subsequently, we argue that analog circuits require very different test methods than those presently used to test digital circuits. We then describe four common analog test methods and their measurement setups. We also describe how analog testing can be accomplished using digital sampling techniques. Finally, we close this tutorial with a brief description of several developments presently underway on the design of testable mixed-signal circuits.
Keywords :
integrated circuit testing; mixed analogue-digital integrated circuits; signal sampling; manufacturing defects; manufacturing environment; measurement setups; mixed-signal testing; product cost; quality; Analog circuits; Circuit testing; Costs; Design methodology; Digital circuits; Laboratories; Manufacturing; Microelectronics; System testing; Test equipment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer-Aided Design, 1996. ICCAD-96. Digest of Technical Papers., 1996 IEEE/ACM International Conference on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-8186-7597-7
Type :
conf
DOI :
10.1109/ICCAD.1996.569904
Filename :
569904
Link To Document :
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