Detecting the topographic, chemical, and magnetic contrast at surfaces with nm spatial resolution

Scanning tunnelling microscopy overshadowed other microscopy techniques owing to its unprecedented spatial resolution. However, the lack of secondary electrons in the experiment always motivated the quest for a complementary technique. The topografiner technology - a precursor of the STM - could not meet this task so far. Nevertheless, it still plays an important role in the arsenal of probing techniques. In this report, we present secondary-electron distributions of low-energy primary electrons directed at a cleaved GaAs(110) surface and preliminary measurements of single-energy surface imaging in a hybrid experiment.