DocumentCode :
230640
Title :
Negative conductance of silicon cathode with DLC coating
Author :
Goncharuk, N.M. ; Karushkin, N.F.
Author_Institution :
Res. Inst. “Orion”, Kiev, Ukraine
fYear :
2014
fDate :
6-10 July 2014
Firstpage :
92
Lastpage :
93
Abstract :
Microwave impedance of diode structures on base of resonant and non-resonant emission of silicon cathode with diamond like coating (DLC) was investigated in small-signal approach. Negative conductance of the diode is caused by delays of electron emission and transit. Its frequency spectrum is located in sub-millimeter or terahertz frequency range depending on electric field and parameters of cathode coating and transit layer. The last values determine emission conductivity, emission delay time and character of emission (resonant or non-resonant).
Keywords :
cathodes; coatings; delays; diamond-like carbon; electric fields; electron emission; microwave diodes; silicon; DLC coating; diamond like coating; diode structures; electric field; electron emission delays; emission conductivity; emission delay time; frequency spectrum; microwave impedance; negative conductance; nonresonant emission; resonant emission; silicon cathode coating; small-signal approach; submillimeter frequency range; terahertz frequency range; transit delays; transit layer; Coatings; Resonant frequency; Time-frequency analysis; DLC cathode; emission and transit delay; negative conductance; resonant and nonresonant electron emission;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Nanoelectronics Conference (IVNC), 2014 27th International
Conference_Location :
Engelberg
Print_ISBN :
978-1-4799-5306-6
Type :
conf
DOI :
10.1109/IVNC.2014.6894773
Filename :
6894773
Link To Document :
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