DocumentCode
2306678
Title
Digital sensitivity: predicting signal interaction using functional analysis
Author
Kirkpatrick, D.A. ; Sangiovanni-Vincentelli, A.L.
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
fYear
1996
fDate
10-14 Nov. 1996
Firstpage
536
Lastpage
541
Abstract
Maintaining signal integrity in digital systems is becoming increasingly difficult due to the rising number of analog effects seen in deep submicron design. One such effect, the signal crosstalk problem, is now a serious design concern. Signals which couple electrically may not affect system behavior because of timing or function in the digital domain. If we can isolate observable coupling then we can constrain layout synthesis to eliminate them. In this paper, we find that it is possible to predict signal interaction by signal functionality alone, leading to a significant amount of robust switching isolation, independent of parasitics introduced by layout or semiconductor process. We introduce techniques to predict signal interaction using functional sensitivity analysis. In general sequential networks we find that significant switching isolation can be extracted with efficient sensitivity analysis algorithms, thus giving promise to the goal of synthesizing layout free from crosstalk effects.
Keywords
circuit layout CAD; crosstalk; digital systems; logic CAD; sensitivity analysis; timing; deep submicron design; digital sensitivity; digital systems; functional analysis; functional sensitivity analysis; layout synthesis; observable coupling; parasitics; robust switching isolation; semiconductor process; sequential networks; signal crosstalk problem; signal integrity; signal interaction; signal interaction prediction; switching isolation; timing; Couplings; Crosstalk; Digital systems; Lead compounds; Robustness; Sensitivity analysis; Signal design; Signal processing; Signal synthesis; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer-Aided Design, 1996. ICCAD-96. Digest of Technical Papers., 1996 IEEE/ACM International Conference on
Conference_Location
San Jose, CA, USA
Print_ISBN
0-8186-7597-7
Type
conf
DOI
10.1109/ICCAD.1996.569907
Filename
569907
Link To Document