DocumentCode :
2306678
Title :
Digital sensitivity: predicting signal interaction using functional analysis
Author :
Kirkpatrick, D.A. ; Sangiovanni-Vincentelli, A.L.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
fYear :
1996
fDate :
10-14 Nov. 1996
Firstpage :
536
Lastpage :
541
Abstract :
Maintaining signal integrity in digital systems is becoming increasingly difficult due to the rising number of analog effects seen in deep submicron design. One such effect, the signal crosstalk problem, is now a serious design concern. Signals which couple electrically may not affect system behavior because of timing or function in the digital domain. If we can isolate observable coupling then we can constrain layout synthesis to eliminate them. In this paper, we find that it is possible to predict signal interaction by signal functionality alone, leading to a significant amount of robust switching isolation, independent of parasitics introduced by layout or semiconductor process. We introduce techniques to predict signal interaction using functional sensitivity analysis. In general sequential networks we find that significant switching isolation can be extracted with efficient sensitivity analysis algorithms, thus giving promise to the goal of synthesizing layout free from crosstalk effects.
Keywords :
circuit layout CAD; crosstalk; digital systems; logic CAD; sensitivity analysis; timing; deep submicron design; digital sensitivity; digital systems; functional analysis; functional sensitivity analysis; layout synthesis; observable coupling; parasitics; robust switching isolation; semiconductor process; sequential networks; signal crosstalk problem; signal integrity; signal interaction; signal interaction prediction; switching isolation; timing; Couplings; Crosstalk; Digital systems; Lead compounds; Robustness; Sensitivity analysis; Signal design; Signal processing; Signal synthesis; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer-Aided Design, 1996. ICCAD-96. Digest of Technical Papers., 1996 IEEE/ACM International Conference on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-8186-7597-7
Type :
conf
DOI :
10.1109/ICCAD.1996.569907
Filename :
569907
Link To Document :
بازگشت