DocumentCode :
2306857
Title :
Ion sources for nanofabrication and high resolution lithography
Author :
Melngailis, J.
Author_Institution :
Maryland Univ., College Park, MD, USA
Volume :
1
fYear :
2001
fDate :
2001
Firstpage :
76
Abstract :
Ion sources that are used to produce nanometer resolution patterns directly on the substrate are either point sources or volume plasma sources. The point sources are used in focused ion beam systems which focus an image of the point on the sample. These sources are, in practice gallium liquid metal. Other sources, such as gas field ion sources, are also being considered. Volume plasma sources are used with ion projection, where instead of the image of a point source, the image of a "back illuminated" stencil mask is projected on the substrate. The operation, application, and characteristics of the three types of sources are reviewed and compared
Keywords :
gallium; ion beam lithography; liquid metal ion sources; nanotechnology; particle beam focusing; plasma materials processing; plasma production; Ga; back illuminated stencil mask; focused ion beam systems; gallium liquid metal; gas field ion sources; high resolution lithography; ion projection; ion sources; nanofabrication; nanometer resolution patterns; point sources; substrate; volume plasma sources; Circuits; Conductive films; Electronics industry; Focusing; Ion beams; Ion sources; Lithography; Nanofabrication; Plasma sources; Substrates;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Particle Accelerator Conference, 2001. PAC 2001. Proceedings of the 2001
Conference_Location :
Chicago, IL
Print_ISBN :
0-7803-7191-7
Type :
conf
DOI :
10.1109/PAC.2001.987436
Filename :
987436
Link To Document :
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