DocumentCode :
230686
Title :
Field emission beam characteristics of a double-gate single nanoemitter
Author :
Chiwon Lee ; Kanungo, P. Das ; Guzenko, Vitaliy ; Hefenstein, Patrick ; Tsujino, Soichiro ; Kassier, Gunther ; Casandruc, Albert ; Miller, R. J. Dwayne
Author_Institution :
Lab. for Micro- & Nanotechnol., Paul Scherrer Inst., Villigen, Switzerland
fYear :
2014
fDate :
6-10 July 2014
Firstpage :
167
Lastpage :
168
Abstract :
We study field emission characteristics of an all-metal double-gate single nanotip emitter to explore the feasibility of such emitters for applications that require extremely high beam brightness and coherence. The single-tip device showed an excellent beam collimation characteristic including an order of magnitude reduction of the transverse velocity spread and an order of magnitude enhancement of beam intensity as reported with array devices previously. The evolution of the beam image with the increase of the collimation potential indicated the importance of subnanometer corrugation at the nanotip apex surface.
Keywords :
electron beams; electron field emission; nanofabrication; all metal double gate single nanotip emitter; beam collimation characteristic; beam intensity; field emission beam characteristics; nanotip apex surface; order of magnitude enhancement; subnanometer corrugation; transverse velocity spread; Laser beams; Laser stability; Logic gates; Surface emitting lasers; Surface treatment; System-on-chip; brightness; double-gated field emitter; electron beam collimation; field emission;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Nanoelectronics Conference (IVNC), 2014 27th International
Conference_Location :
Engelberg
Print_ISBN :
978-1-4799-5306-6
Type :
conf
DOI :
10.1109/IVNC.2014.6894795
Filename :
6894795
Link To Document :
بازگشت