• DocumentCode
    230686
  • Title

    Field emission beam characteristics of a double-gate single nanoemitter

  • Author

    Chiwon Lee ; Kanungo, P. Das ; Guzenko, Vitaliy ; Hefenstein, Patrick ; Tsujino, Soichiro ; Kassier, Gunther ; Casandruc, Albert ; Miller, R. J. Dwayne

  • Author_Institution
    Lab. for Micro- & Nanotechnol., Paul Scherrer Inst., Villigen, Switzerland
  • fYear
    2014
  • fDate
    6-10 July 2014
  • Firstpage
    167
  • Lastpage
    168
  • Abstract
    We study field emission characteristics of an all-metal double-gate single nanotip emitter to explore the feasibility of such emitters for applications that require extremely high beam brightness and coherence. The single-tip device showed an excellent beam collimation characteristic including an order of magnitude reduction of the transverse velocity spread and an order of magnitude enhancement of beam intensity as reported with array devices previously. The evolution of the beam image with the increase of the collimation potential indicated the importance of subnanometer corrugation at the nanotip apex surface.
  • Keywords
    electron beams; electron field emission; nanofabrication; all metal double gate single nanotip emitter; beam collimation characteristic; beam intensity; field emission beam characteristics; nanotip apex surface; order of magnitude enhancement; subnanometer corrugation; transverse velocity spread; Laser beams; Laser stability; Logic gates; Surface emitting lasers; Surface treatment; System-on-chip; brightness; double-gated field emitter; electron beam collimation; field emission;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Nanoelectronics Conference (IVNC), 2014 27th International
  • Conference_Location
    Engelberg
  • Print_ISBN
    978-1-4799-5306-6
  • Type

    conf

  • DOI
    10.1109/IVNC.2014.6894795
  • Filename
    6894795