مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

230691

Title :

Photo-cathode analysis for SwissFEL

Author :

Schaer, M. ; Craievich, Paolo ; Stingelin, L.

Author_Institution :

Paul Scherrer Inst., Villigen, Switzerland

fYear :

2014

fDate :

6-10 July 2014

Firstpage :

174

Lastpage :

175

Abstract :

The SwissFEL facility is currently being built at Paul Scherrer Institut (PSI) and aims at the generation of sub-nanometer X-rays within a pulse duration in the order of 10 fs, by sending a high energy electron beam through undulators [1]. A key parameter to achieve this goal is the transverse brightness B_⊥ ∝ / I/ε_r² of the electron beam at the exit of the injector. A high peak current I and a low transverse emittance ε_r are required in order for the lasing process to work efficiently.

Keywords :

electron beams; free electron lasers; wigglers; Paul Scherrer Institut; SwissFEL facility; high energy electron beam; lasing process; photo-cathode analysis; pulse duration; sub-nanometer X-rays; transverse emittance; undulators; Cathodes; Copper; Laser beams; Lasers; Radio frequency; Solenoids; Standards;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Vacuum Nanoelectronics Conference (IVNC), 2014 27th International

Conference_Location :

Engelberg

Print_ISBN :

978-1-4799-5306-6

Type :

conf

DOI :

10.1109/IVNC.2014.6894797

Filename :

6894797

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=230691