DocumentCode
2307009
Title
Fluxless die bonding for optoelectronics
Author
Boudreau, R. ; Tabasky, M. ; Armiento, C. ; Bellows, A. ; Cataldo, V. ; Morrison, R. ; Urban, M. ; Sargent, R. ; Negri, A. ; Haugsjaa, P.
Author_Institution
GTE Labs. Inc., Waltham, MA, USA
fYear
1993
fDate
1-4 Jun 1993
Firstpage
485
Lastpage
490
Abstract
Two new approaches are described for epi-down die bonding of diode lasers. The first approach, based on an acetic acid vapor flux, eliminates complications associated with the use of liquid flux in optoelectronic packaging. Based on this approach, InGaAsP/InP laser arrays were soldered onto silicon substrates. These laser arrays, which were passively aligned to single-mode optical fibers on the silicon substrate, had thermal impedances comparable to those obtained using conventional liquid flux. The second approach, called bridged die bonding, is proposed as a technique for reducing stress associated with epi-down bonding of diode lasers with hard solders. Bridged die bonding seeks to minimize bonding stress by avoiding contact of the laser active region with the hard solder. Thermal modeling indicates that the bridged die bonding approach, which uses a solder pattern with an air gap, can provide a thermal impedance comparable to conventional soldering techniques
Keywords
III-V semiconductors; gallium arsenide; indium compounds; microassembling; optical workshop techniques; packaging; semiconductor laser arrays; semiconductor technology; soldering; InGaAsP-InP; InGaAsP/InP laser arrays; Si; acetic acid vapor flux; air gap; bonding stress; bridged die bonding; diode lasers; epi-down die bonding; fluxless die bonding; hard solders; optoelectronic packaging; passive alignment; silicon substrates; single-mode optical fibers; soldering; thermal impedances; thermal modeling; Bonding; Diode lasers; Fiber lasers; Impedance; Microassembly; Optical arrays; Packaging; Semiconductor laser arrays; Silicon; Thermal stresses;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 1993. Proceedings., 43rd
Conference_Location
Orlando, FL
Print_ISBN
0-7803-0794-1
Type
conf
DOI
10.1109/ECTC.1993.346801
Filename
346801
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