• DocumentCode
    2307574
  • Title

    Mechanical and materials modeling/simulation/verification trend for electronics packaging products

  • Author

    Lim, C.K.

  • Author_Institution
    Dept. of Technol. Products, IBM Corp., Endicott, NY, USA
  • fYear
    1993
  • fDate
    1-4 Jun 1993
  • Firstpage
    238
  • Lastpage
    248
  • Abstract
    Theoretical modeling and simulation have been used to address stress/strain related issues in microelectronics packages. Over time, the emphasis has moved from the problem solving mode to the predictive mode. With ever shrinking development schedules, the need to verify the validity of these models has become increasingly important. Although numerical modeling tools and algorithms have improved significantly over the years, recent advances in micromechanical and photomechanical tools have been the key in verifying the model leading to an enhanced and realistic model. This paper reviews some of the latest developments in micromechanical and photomechanical devices with up to 20 nm displacement sensitivity capability. Several examples of their implementation in an electronics packaging development environment will be presented. These verification tools lead to more accurate and realistic models, which in turn, facilitate design optimization at an early stage
  • Keywords
    deformation; displacement measurement; light interferometry; micromechanical devices; modelling; packaging; simulation; thermal stress cracking; design optimization; electronics packaging products; materials modeling; mechanical modelling; micromechanical devices; photomechanical devices; predictive mode; simulation; verification tools; Capacitive sensors; Computational modeling; Electronics packaging; Holographic optical components; Holography; Micromechanical devices; Optical interferometry; Optical sensors; Predictive models; Problem-solving;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1993. Proceedings., 43rd
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    0-7803-0794-1
  • Type

    conf

  • DOI
    10.1109/ECTC.1993.346834
  • Filename
    346834