850 nm serial VSR in 10 Gbps communication systems

Author

Bisberg, Jeff E. ; Simoneaux, Chris J.

Author_Institution

Cielo Commun. Inc., Broomfield, CO, USA

fYear

2002

fDate

17-22 Mar 2002

Firstpage

787

Lastpage

788

Abstract

In conclusion, interoperability testing between competitive VCSEL-based 10Gbps 850nm serial transponders demonstrated the feasibility of 10 GBASE-SR/SW technologies. At lower data rates, 850 nm VCSELs have historically been a low cost and reliable source laser. By applying this technology to 10 Gbps products, these optical components offer the potential to dramatically change the cost structure of optical ports and thus reduce the cost of deploying high bandwidth optical networking equipment.

Keywords

laser reliability; open systems; optical communication equipment; optical testing; semiconductor device reliability; semiconductor device testing; semiconductor lasers; surface emitting lasers; telecommunication network reliability; transponders; 850 nm; Gbps communication systems; VCSEL-based serial transponders; VCSELs; cost structure; high bandwidth optical networking equipment; optical ports; reliable source laser; serial VSR; Costs; Economies of scale; Ethernet networks; Optical fiber cables; Optical fiber networks; Optical packet switching; Standards organizations; Stimulated emission; Surface emitting lasers; Vertical cavity surface emitting lasers;

fLanguage

English

Publisher

ieee

Conference_Titel

Optical Fiber Communication Conference and Exhibit, 2002. OFC 2002

Print_ISBN

1-55752-701-6

Type

conf

DOI

10.1109/OFC.2002.1036718

Filename

1036718