• DocumentCode
    2307816
  • Title

    Statistical sampling and regression analysis for RT-Level power evaluation

  • Author

    Cheng-Ta Hsieh ; Qing Wu ; Chih-Shun Ding ; Pedram, M.

  • Author_Institution
    Dept. of Electr. Eng. Syst., Univ. of Southern California, Los Angeles, CA, USA
  • fYear
    1996
  • fDate
    10-14 Nov. 1996
  • Firstpage
    583
  • Lastpage
    588
  • Abstract
    In this paper, we propose a statistical power evaluation framework at the RT-level. We first discuss the power macro-modeling formulation, and then propose a simple random sampling technique to alleviate the the overhead of macro-modeling during RTL simulation. Next, we describe a regression estimator to reduce the error of the macro-modeling approach. Experimental results indicate that the execution time of the simple random sampling combined with power macro-modeling is 50 X lower than that of conventional macro-modeling while the percentage error of regression estimation combined with power macro-modeling is 16 X lower than that of conventional macro-modeling. Hence, we provide the designer with options to either improve the accuracy or the execution time when using power macro-modeling in the context of RTL simulation.
  • Keywords
    circuit analysis computing; statistical analysis; RT-Level power evaluation; RTL simulation; power macro-modeling formulation; random sampling; regression analysis; regression estimator; statistical sampling; Capacitance; Circuit simulation; Clocks; Contracts; Energy consumption; Equations; Reactive power; Regression analysis; Sampling methods; Statistics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design, 1996. ICCAD-96. Digest of Technical Papers., 1996 IEEE/ACM International Conference on
  • Conference_Location
    San Jose, CA, USA
  • Print_ISBN
    0-8186-7597-7
  • Type

    conf

  • DOI
    10.1109/ICCAD.1996.569914
  • Filename
    569914