DocumentCode :
2307816
Title :
Statistical sampling and regression analysis for RT-Level power evaluation
Author :
Cheng-Ta Hsieh ; Qing Wu ; Chih-Shun Ding ; Pedram, M.
Author_Institution :
Dept. of Electr. Eng. Syst., Univ. of Southern California, Los Angeles, CA, USA
fYear :
1996
fDate :
10-14 Nov. 1996
Firstpage :
583
Lastpage :
588
Abstract :
In this paper, we propose a statistical power evaluation framework at the RT-level. We first discuss the power macro-modeling formulation, and then propose a simple random sampling technique to alleviate the the overhead of macro-modeling during RTL simulation. Next, we describe a regression estimator to reduce the error of the macro-modeling approach. Experimental results indicate that the execution time of the simple random sampling combined with power macro-modeling is 50 X lower than that of conventional macro-modeling while the percentage error of regression estimation combined with power macro-modeling is 16 X lower than that of conventional macro-modeling. Hence, we provide the designer with options to either improve the accuracy or the execution time when using power macro-modeling in the context of RTL simulation.
Keywords :
circuit analysis computing; statistical analysis; RT-Level power evaluation; RTL simulation; power macro-modeling formulation; random sampling; regression analysis; regression estimator; statistical sampling; Capacitance; Circuit simulation; Clocks; Contracts; Energy consumption; Equations; Reactive power; Regression analysis; Sampling methods; Statistics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer-Aided Design, 1996. ICCAD-96. Digest of Technical Papers., 1996 IEEE/ACM International Conference on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-8186-7597-7
Type :
conf
DOI :
10.1109/ICCAD.1996.569914
Filename :
569914
Link To Document :
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