Electrical and thermal testing and modelling of breakdown in space solar cells and generators

Author

David, Jean Pierre ; Duveau, J. ; Guerin, J. ; Michel, A.

Author_Institution

Lab. de Photoelectricite, Univ. de Provence, Marseille, France

fYear

1993

fDate

10-14 May 1993

Firstpage

1415

Lastpage

1420

Abstract

The paper presents a summing up of experimental results relative to electrical and thermal testing of destroying breakdown apt to occur in a space solar array when a cell may be reverse biased due for instance to accidental shadowing. The results give time during which the cell can withstand the power corresponding to reverse biasing without destruction. Infrared observations of hot spots are also presented and typical damage caused by breakdown in cells are described. A comparison is made with results obtained for thermal simulation of hot spot phenomenon induced and also for an electrical modelling of breakdown involving cell edges impurities or defects influence

Keywords

electric breakdown of solids; infrared imaging; photovoltaic power systems; semiconductor device models; semiconductor device testing; solar cells; space vehicle power plants; temperature measurement; accidental shadowing; breakdown modelling; cell edges impurities; defects; electrical modelling; electrical testing; hot spots investigation; infrared observations; reverse biased; space solar cells; space solar generators; thermal simulation; thermal testing; Aerospace testing; Breakdown voltage; Electric breakdown; Performance evaluation; Photovoltaic cells; Shadow mapping; Silicon; Solar power generation; Temperature; Vacuum breakdown;

fLanguage

English

Publisher

ieee

Conference_Titel

Photovoltaic Specialists Conference, 1993., Conference Record of the Twenty Third IEEE

Conference_Location

Louisville, KY

Print_ISBN

0-7803-1220-1

Type

conf

DOI

10.1109/PVSC.1993.346909

Filename

346909