Title :
Electrical and thermal testing and modelling of breakdown in space solar cells and generators
Author :
David, Jean Pierre ; Duveau, J. ; Guerin, J. ; Michel, A.
Author_Institution :
Lab. de Photoelectricite, Univ. de Provence, Marseille, France
Abstract :
The paper presents a summing up of experimental results relative to electrical and thermal testing of destroying breakdown apt to occur in a space solar array when a cell may be reverse biased due for instance to accidental shadowing. The results give time during which the cell can withstand the power corresponding to reverse biasing without destruction. Infrared observations of hot spots are also presented and typical damage caused by breakdown in cells are described. A comparison is made with results obtained for thermal simulation of hot spot phenomenon induced and also for an electrical modelling of breakdown involving cell edges impurities or defects influence
Keywords :
electric breakdown of solids; infrared imaging; photovoltaic power systems; semiconductor device models; semiconductor device testing; solar cells; space vehicle power plants; temperature measurement; accidental shadowing; breakdown modelling; cell edges impurities; defects; electrical modelling; electrical testing; hot spots investigation; infrared observations; reverse biased; space solar cells; space solar generators; thermal simulation; thermal testing; Aerospace testing; Breakdown voltage; Electric breakdown; Performance evaluation; Photovoltaic cells; Shadow mapping; Silicon; Solar power generation; Temperature; Vacuum breakdown;
Conference_Titel :
Photovoltaic Specialists Conference, 1993., Conference Record of the Twenty Third IEEE
Conference_Location :
Louisville, KY
Print_ISBN :
0-7803-1220-1
DOI :
10.1109/PVSC.1993.346909
