• DocumentCode
    2308284
  • Title

    Perturbative solution for the scattering from multilayered structure with rough boundaries

  • Author

    Imperatore, Pasquale ; Iodice, Antonio ; Riccio, Daniele

  • Author_Institution
    Dipt. di Ing. Elettron. e delle Telecomun., Univ. di Napoli "Federico II", Naples
  • fYear
    2008
  • fDate
    11-14 March 2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The objective of this paper is to investigate analytically the fully polarimetric electromagnetic wave scattering and emission from a three-dimensional layered structure with N-rough interfaces in the framework of SPM method. Assuming that deviations and slopes - with respect to the reference mean plane - exhibited by rough interfaces are small enough, we firstly perform a perturbative expansion of the fields in the rough-interfaces layered structure, following the classical scheme employed to deal with a rough surface. Subsequently, by using effectively the concept of generalized reflection/transmission coefficients, the unknown expansion coefficients of scattered wave propagating upward in the upper half-space are derived via a recursive method. This approach can be also applied to the evaluation of the second-order contribution, opening the way to the accurate calculation of thermal emission from complex layered structure.
  • Keywords
    electromagnetic wave polarisation; electromagnetic wave scattering; geophysical techniques; perturbation theory; polarimetry; rough surfaces; 3D layered structure; SPM method; multilayered structure scattering; perturbative solution; polarimetric electromagnetic wave scattering; rough boundaries; Electromagnetic analysis; Electromagnetic scattering; Nonhomogeneous media; Ocean temperature; Radar scattering; Reflection; Rough surfaces; Scanning probe microscopy; Sea surface; Surface roughness; Layered media; Perturbation Methods; Sub-Surface Sensing; Surface & Volume Scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Radiometry and Remote Sensing of the Environment, 2008. MICRORAD 2008
  • Conference_Location
    Firenze
  • Print_ISBN
    978-1-4244-1986-9
  • Electronic_ISBN
    978-1-4244-1987-6
  • Type

    conf

  • DOI
    10.1109/MICRAD.2008.4579482
  • Filename
    4579482