DocumentCode
2308722
Title
Testing the IBM Power 7™ 4 GHz eight core microprocessor
Author
Crafts, James ; Bogdan, David ; Conti, Dennis ; Forlenza, Donato ; Forlenza, Orazio ; Huott, William ; Kusko, Mary ; Seymour, Edward ; Taylor, Timothy ; Walsh, Brian
Author_Institution
IBM, Burlington, VT, USA
fYear
2010
fDate
2-4 Nov. 2010
Firstpage
1
Lastpage
10
Abstract
The IBM Power 7™ 4 GHz, eight core microprocessor introduced several new challenges for the Power 7 test team: new pervasive test architecture, 8 asynchronous processor cores, DRAM integrated on the same die as processor and enhanced thermal test requirements. The design complexity, time to market schedule compression, and rapid production ramp required innovation and new methods to meet these challenges. The following is an overview of the design for test architecture, manufacturing test methodology, thermal calibration, and rapid yield learning deployed to address these challenges and deliver a leadership server processor.
Keywords
DRAM chips; microprocessor chips; testing; IBM Power 7 Eight Core Microprocessor; asynchronous processor cores; design complexity; frequency 4 GHz; integrated DRAM; testing; thermal test requirements; time-to-market schedule compression;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference (ITC), 2010 IEEE International
Conference_Location
Austin, TX
ISSN
1089-3539
Print_ISBN
978-1-4244-7206-2
Type
conf
DOI
10.1109/TEST.2010.5699204
Filename
5699204
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