• DocumentCode
    2308733
  • Title

    Optimization of burn-in test for many-core processors through adaptive spatiotemporal power migration

  • Author

    Cho, Minki ; Sathe, Nikhil ; Raychowdhur, Arijit ; Mukhopadhyay, Saibal

  • Author_Institution
    Sch. of ECE, Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    2010
  • fDate
    2-4 Nov. 2010
  • Firstpage
    1
  • Lastpage
    9
  • Abstract
    We present adaptive spatiotemporal power migration (ASTPM) for burn-in of many core chips. ASTPM adapts the number of simultaneously stressed cores and dynamically varies their location to prevent thermal runaway, improve test-quality, and optimize burn-in time.
  • Keywords
    multiprocessing systems; adaptive spatiotemporal power migration; burn-in test; many-core processors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference (ITC), 2010 IEEE International
  • Conference_Location
    Austin, TX
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-7206-2
  • Type

    conf

  • DOI
    10.1109/TEST.2010.5699205
  • Filename
    5699205
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2308733