Author :
Dutt, Nikil ; Drechsler, Rolf ; Chakrabarty, Krishnendu ; Bhattacharyya, S.P.
Author_Institution :
Center for Embedded Comput. Syst. Univ. of California, Irvine, CA, USA
Abstract :
The following topics are dealt with: cross-layer error awareness for embedded systems; synthesis of reversible circuits using decision diagrams; demystifying board-level test and diagnosis; and linear circuits.
Keywords :
analogue integrated circuits; decision diagrams; embedded systems; printed circuits; board-level diagnosis; cross-layer error awareness; decision diagrams; demystifying board-level test; embedded systems; linear circuits; reversible circuits;
Conference_Titel :
Electronic System Design (ISED), 2012 International Symposium on
Conference_Location :
Kolkata
Print_ISBN :
978-1-4673-4704-4
DOI :
10.1109/ISED.2012.82
