Title :
An innovative remote experiment system for FPGA-based curriculum
Author :
Zhao Hui ; Xiao Tie-jun
Author_Institution :
Sch. of Comput. Sci. & Telecommun. Eng., Jiangsu Univ., Jiangsu
Abstract :
An innovative remote experiment system is brought forward and realized in the paper, which is developed to allow using of FPGA devices remotely via World Wide Web. Using this system, students would have the opportunities to design digital circuits and implement them into FPGA, even if the FPGA devices are not available in their location. The system is aimed at structuring a new open mode of computer hardware design experiment, supplementing remote theory teaching effectively, and resolving the problem that experiment teaching could not keep up with theory teaching in the distance education. There are two innovative approaches in the system design. The first, the network of the system is built based on embedded Web services technology, which is in the lead in technology field. The second is using boundary-scan technology as electric probe to realize remote experiment verification. There are no precedents applying boundary-scan testing technology to the experiment system in education field, so the idea is original.
Keywords :
Web services; boundary scan testing; circuit CAD; computer aided instruction; digital circuits; distance learning; embedded systems; field programmable gate arrays; FPGA-based curriculum; World Wide Web; boundary-scan testing technology; computer hardware design experiment; digital circuits design; distance education; embedded Web services technology; innovative remote experiment system; Digital circuits; Distance learning; Education; Educational technology; Field programmable gate arrays; Hardware; Probes; System testing; Web services; Web sites; FPGA; Remote experiment system; Web Services; boundary-scan testing technology;
Conference_Titel :
IT in Medicine and Education, 2008. ITME 2008. IEEE International Symposium on
Conference_Location :
Xiamen
Print_ISBN :
978-1-4244-3616-3
Electronic_ISBN :
978-1-4244-2511-2
DOI :
10.1109/ITME.2008.4743991