DocumentCode :
2308975
Title :
Synthetic DSP approach for novel FPGA-based measurement of error vector magnitude
Author :
Morris, Devin ; Eisenstadt, William R. ; Paganini, Andrea ; Slamani, Mustapha ; Platt, Timothy ; Ferrario, John
Author_Institution :
Univ. of Florida, Gainesville, FL, USA
fYear :
2010
fDate :
2-4 Nov. 2010
Firstpage :
1
Lastpage :
8
Abstract :
A new implementation of EVM measurement has been developed in a production test environment using an FPGA-based DSP processor within an ATE test solution. The focus of interest is in identifying key areas of the DSP that affect measurement quality and optimizing their execution on an FPGA to increase measurement accuracy, precision, repeatability, and reduce test time. This approach defines a real-time processing methodology for signal demodulation and EVM calculation as opposed to traditional PC-based post processing and offline computation of EVM. The analysis of the DSP elements and their corresponding error artifacts are presented in a standard approach to EVM measurement. The experimental results of the digital demodulation system and EVM measurement in MATLAB/Simulink are compared against a bench-top Rohde&Schwarz complex signal generator and vector signal analyzer to qualify the results.
Keywords :
automatic test equipment; demodulation; digital signal processing chips; error analysis; field programmable gate arrays; integrated circuit measurement; integrated circuit testing; production testing; radiofrequency integrated circuits; ATE test solution; DSP elements; EVM calculation; EVM measurement; FPGA-based DSP processor; FPGA-based measurement; MATLAB-Simulink; RFIC; automated test equipment; bench-top Rohde&Schwarz complex signal generator; digital demodulation system; error artifact analysis; error vector magnitude measurement; measurement accuracy; measurement precision; production test; radio frequency integrated circuits; real-time processing methodology; repeatability; signal demodulation; synthetic DSP approach; vector signal analyzer; Automated Test Equipment (ATE); Design For Test (DFT); Device Under Test (DUT); Digital Signal Processing (DSP); Error Vector Magnitude (EVM); Field Programmable Gate Arrays (FPGA); Finite Impulse Response (FIR); Radio Frequency Integrated Circuits (RFIC); Vector Signal Analyzer (VSA);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference (ITC), 2010 IEEE International
Conference_Location :
Austin, TX
ISSN :
1089-3539
Print_ISBN :
978-1-4244-7206-2
Type :
conf
DOI :
10.1109/TEST.2010.5699224
Filename :
5699224
Link To Document :
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