DocumentCode :
2309001
Title :
Increasing PRPG-based compression by delayed justification
Author :
Wohl, P. ; Waicukauski, J.A. ; Finklea, T.
fYear :
2010
fDate :
2-4 Nov. 2010
Firstpage :
1
Lastpage :
10
Abstract :
Scan testing and scan compression have become key components for reducing test cost, and most high-compression schemes are based on linear, sequential compressors e.g., pseudo-random pattern generators (PRPG). We present a novel technique to increase PRPG-based compression by modifying test generation so that justification of certain decision nodes is delayed and merged with PRPG seed computation. Our method does not affect test coverage or diagnosis, requires no hardware support, and can be applied to any linear compression scheme. Results on industrial designs demonstrate consistent increase in compression.
Keywords :
automatic test pattern generation; delays; fault diagnosis; integrated circuit testing; ATPG-based method; PRPG seed computation; PRPG-based compression; automatic test pattern generation; decision node justification; delayed justification; fault test; industrial designs; linear compression scheme; linear sequential compressors; pseudorandom pattern generators; scan compression; scan testing; test cost reduction; test generation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference (ITC), 2010 IEEE International
Conference_Location :
Austin, TX
ISSN :
1089-3539
Print_ISBN :
978-1-4244-7206-2
Type :
conf
DOI :
10.1109/TEST.2010.5699226
Filename :
5699226
Link To Document :
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