• DocumentCode
    2309043
  • Title

    Influence of the cohesive energy density of polymers and of the nature of metal-polymer interface on the contact charging of polymers

  • Author

    Crine, Jean-Pierre ; Vijh, Ashok K.

  • Author_Institution
    Hydro-Quebec, Varennes, Que., Canada
  • fYear
    1989
  • fDate
    29 Oct-2 Nov 1989
  • Firstpage
    284
  • Lastpage
    289
  • Abstract
    An attempt is made to show that there is a relation between the amount of transferred charge and the free energy (per equivalent) of oxide formation on the metal at a metal-polymer interface. The authors show that there is an approximate linear relation between the amount of charge transferred to polymers and their cohesive energy density (CED), for a given metal electrode. It is suggested that existing data can be described with two empirical linear relations. They imply that there is a triboelectric series among polymers, with negatively charged polymers having the lowest CED and those with high CED being positively charged; and the charge transfer mechanism is partially controlled by the oxide layer on the metal electrode. This means that noble metals (such as gold) are less affected by this phenomenon and therefore are more likely to give the true charge transferred to the polymer
  • Keywords
    metal-insulator boundaries; organic insulating materials; polymers; static electrification; triboelectricity; CED; Pt-PMMA; Pt-PTFE; Pt-PVC; Pt-PVOH; charge transfer mechanism; cohesive energy density; contact charging; empirical linear relations; metal electrode; metal-polymer interface; metal-polystyrene; oxide formation; triboelectric series; Charge transfer; Chemicals; Dielectric constant; Dielectric measurements; Electrodes; Force control; Force measurement; Linear approximation; Polarization; Polymers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 1989. Annual Report., Conference on
  • Conference_Location
    Leesburg, VA
  • Type

    conf

  • DOI
    10.1109/CEIDP.1989.69560
  • Filename
    69560