Title :
RADPro: Automatic RF analyzer and diagnostic program generation tool
Author :
Kannan, S. ; Kim, Bumki ; Srinivasan, Ganesh ; Taenzlar, Friedrich ; Antley, R. ; Force, Craig ; Mohammed, Falah
Author_Institution :
Univ. of Alabama, Tuscaloosa, AL, USA
Abstract :
This paper provides development of an RF circuit software tool that generates diagnostic programs automatically for device interface boards. The diagnostic tool utilizes novel techniques to differentiate faulty RF circuits embedded in printed circuit boards. The diagnostic tool provides user-transparent pseudocodes with high fault coverage and significantly decreases time to market.
Keywords :
automatic test software; fault diagnosis; integrated circuit testing; printed circuit testing; printed circuits; radiofrequency integrated circuits; software tools; RADPro; RF circuit software tool; automatic RF analyzer; device interface boards; diagnostic program generation tool; embedded faulty RF circuits; fault coverage; printed circuit boards; user-transparent pseudocodes;
Conference_Titel :
Test Conference (ITC), 2010 IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-7206-2
DOI :
10.1109/TEST.2010.5699233
