• DocumentCode
    2309125
  • Title

    nGFSIM : A GPU-based fault simulator for 1-to-n detection and its applications

  • Author

    Li, Huawei ; Xu, Dawen ; Han, Yinhe ; Cheng, Kwang-Ting ; Li, Xiaowei

  • Author_Institution
    Key Lab. of Comput. Syst. & Archit., Chinese Acad. of Sci., Beijing, China
  • fYear
    2010
  • fDate
    2-4 Nov. 2010
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    We present nGFSIM, a GPU-based fault simulator for stuck-at faults which can report the fault coverage of one-to n-detection for any specified integer n using only a single run of fault simulation. nGFSIM, which explores the massive parallelism in the GPU architecture and optimizes the memory access and usage, enables accelerated fault simulation without the need of fault dropping. We show that nGFSIM offers a 25X speedup in comparison with a commercial tool and enables new applications in test selection.
  • Keywords
    fault simulation; integrated circuit testing; logic testing; parallel architectures; 1-n detection; GPU architecture parallelism; GPU-based fault simulator; accelerated fault simulation; fault coverage; graphics processing units; memory access; memory usage optimization; n-detection fault simulation; nGFSIM; single-run fault simulation; stuck-at faults;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference (ITC), 2010 IEEE International
  • Conference_Location
    Austin, TX
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-7206-2
  • Type

    conf

  • DOI
    10.1109/TEST.2010.5699235
  • Filename
    5699235