• DocumentCode
    2309270
  • Title

    ADC linearity testing method with single analog monitoring port

  • Author

    Kawachi, Tomohiro ; Irie, Koichi

  • Author_Institution
    Yokogawa Electr. Corp., Inc., Tokyo, Japan
  • fYear
    2010
  • fDate
    2-4 Nov. 2010
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    We propose an ADC linearity testing method with a single analog monitoring port. This method enables direct measurement of code transitions without clocking and digital signal processing. We analyzed code transition measurement errors caused by additional monitoring circuits, and verified that the errors are less than 0.1LSB with simulations. We applied the proposed testing method to laser wafer trimming (LWT) for ADC linearity improvement, and achieved integral non-linearity (INL) 0.26LSB and differential non-linearity (DNL) 0.30LSB respectively.
  • Keywords
    analogue integrated circuits; analogue-digital conversion; integrated circuit measurement; integrated circuit testing; ADC linearity testing; code measurement error; code transition; differential nonlinearity; integral nonlinearity; laser wafer trimming; monitoring circuit; single analog monitoring port;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference (ITC), 2010 IEEE International
  • Conference_Location
    Austin, TX
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-7206-2
  • Type

    conf

  • DOI
    10.1109/TEST.2010.5699244
  • Filename
    5699244
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2309270