• DocumentCode
    2309319
  • Title

    Rotation Invariant Texture Measured by Local Binary Pattern for Remote Sensing Image Classification

  • Author

    Song, Cuiyu ; Yang, Fengjie ; LI, Peijun

  • Author_Institution
    Coll. of Geol. Sci. & Technol., Shandong Univ. of Sci. & Technol., Qingdao, China
  • Volume
    3
  • fYear
    2010
  • fDate
    6-7 March 2010
  • Firstpage
    3
  • Lastpage
    6
  • Abstract
    Studies on rotation invariant texture in remote sensing image processing are relatively rare. Local Binary Pattern (LBP) is a relatively new rotation invariant texture measure which is theoretically simply but powerful. In this paper, the LBP operator was proposed to calculate texture features of the stimulant image derived from high-resolution remote sensing image. The produced texture image was combined with the spectral data in image classification to evaluate the performance of the rotation invariant texture measure. The result was compared to classifications using spectral data alone and plus traditional rotation variant texture images. Experiments demonstrate that compared to spectral classification, the classification overall accuracy can be significantly improved when the rotation invariant texture is included. The results also show that the rotation invariant texture result show a more than four percentage increase in overall accuracy, compared with the classification result with traditional Grey-Level Co-occurrence Matrix texture.
  • Keywords
    geophysical image processing; geophysical techniques; image classification; image texture; remote sensing; high-resolution remote sensing image; image classification; image processing; local binary pattern; rotation invariant image texture measurement; Data mining; Educational technology; Feature extraction; Geologic measurements; Image classification; Image processing; Image texture; Image texture analysis; Remote sensing; Rotation measurement; Grey-Level Co-occurrence Matrix; Local Binary Pattern; Remote sensing image; Rotation Invariance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Education Technology and Computer Science (ETCS), 2010 Second International Workshop on
  • Conference_Location
    Wuhan
  • Print_ISBN
    978-1-4244-6388-6
  • Electronic_ISBN
    978-1-4244-6389-3
  • Type

    conf

  • DOI
    10.1109/ETCS.2010.37
  • Filename
    5460379