Title :
Improving fault diagnosis accuracy by automatic test set modification
Author :
Amati, L. ; Bolchini, C. ; Salice, F. ; Franzoso, F.
Author_Institution :
Dipt. di Elettron. e Inf., Politec. di Milano, Milan, Italy
Abstract :
Fault diagnosis is the task of identifying a faulty component in a complex system using data collecting from a test section. Diagnostic resolution, that is the ability to discriminate a faulty component in a set of possible candidates, is a property that the system model must expose to provide accuracy and robustness in the diagnosis. Such a property depends on the selection of an appropriate test set capable to provide a unique interpretation of the test outcomes. In this paper a quantitative metric for the evaluation of diagnostic resolution of a test set is proposed, together with an algorithm for the minimal extension of a given test set in order to provide a complete discrimination of failures affecting a system, to be used as a support for analysts during the definition of a testing framework.
Keywords :
automatic testing; fault diagnosis; accuracy; automatic test set modification; diagnostic resolution; fault diagnosis;
Conference_Titel :
Test Conference (ITC), 2010 IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-7206-2
DOI :
10.1109/TEST.2010.5699250