• DocumentCode
    2309387
  • Title

    Product modeling framework and language for behavior evaluation

  • Author

    Lee, Jae H. ; Fenves, Steven J. ; Bock, Conrad ; Suh, Hyo-Won ; Rachuri, Sudarsan ; Fiorentini, Xenia ; Sriram, Ram D.

  • Author_Institution
    Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
  • fYear
    2010
  • fDate
    21-24 Aug. 2010
  • Firstpage
    136
  • Lastpage
    143
  • Abstract
    Supporting different stakeholder viewpoints across the product´s entire lifecycle requires semantic richness for representing product related information. This paper proposes a multi-layered product-modeling framework that enables stakeholders to define their product-specific models and relate product-specific models to physical or simulated instances. The framework is defined within the Model-driven Architecture and adapted to the multi-layer approach of the architecture. The data layer represents real world products, the model layer includes models of those products, and the meta-model layer defines the product modeling language. The semantic-based product modeling language described in this paper is specialized from a web ontology language enabling product designers to express the semantics of their product models explicitly and logically in an engineering-friendly way. The interactions between these three layers are described to illustrate how each layer in the framework is used in a product engineering context.
  • Keywords
    CAD; ontologies (artificial intelligence); product design; product life cycle management; production engineering computing; semantic Web; Web ontology language; product behaviour evaluation; product data layer; product design; product lifecycle; product metamodel layer; product model-driven architecture; product modeling framework; product modeling language; product related information; semantic; Atmospheric modeling; Geometry; OWL; Object oriented modeling; Ontologies; Semantics; Syntactics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Automation Science and Engineering (CASE), 2010 IEEE Conference on
  • Conference_Location
    Toronto, ON
  • Print_ISBN
    978-1-4244-5447-1
  • Type

    conf

  • DOI
    10.1109/COASE.2010.5584462
  • Filename
    5584462