• DocumentCode
    2309404
  • Title

    Concurrent test planning

  • Author

    Van Wagenen, Bethany ; Seng, Edward

  • Author_Institution
    Teradyne, Inc., North Reading, MA, USA
  • fYear
    2010
  • fDate
    2-4 Nov. 2010
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    Testing multiple device functions in parallel can yield significant test time and cost of test reductions. This paper discusses the planning process and algorithms required to realize an efficient and achievable concurrent test plan.
  • Keywords
    automatic test equipment; automatic test pattern generation; automatic test software; automatic test equipment; concurrent test planning; multiple device functions; parallel; planning algorithms; planning process; test reductions; test time;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference (ITC), 2010 IEEE International
  • Conference_Location
    Austin, TX
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-7206-2
  • Type

    conf

  • DOI
    10.1109/TEST.2010.5699255
  • Filename
    5699255
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2309404