Title :
Solutions for undetected shorts on IEEE 1149.1 self-monitoring pins
Author :
Clark, C.J. ; Dubberke, Dave ; Parker, Kenneth P. ; Tuthill, Bill
Author_Institution :
Intellitech Corp, Dover, NH, USA
Abstract :
This paper presents the problem of undetected shorts on IEEE 1149.1 compliant self-monitoring pins. Unidirectional and bidirectional self-monitoring pins may contain sufficient series termination resistance and low enough voltage swings such that shorts between two pins become resistively isolated from the receivers and therefore are undetected during wiring interconnect tests. Potential solutions to mitigate the problem are offered.
Keywords :
boundary scan testing; integrated circuit interconnections; integrated circuit testing; short-circuit currents; IEEE 1149.1 compliant self-monitoring pin; bidirectional self-monitoring pin; series termination resistance; undetected shorts; unidirectional self-monitoring pin; voltage swing; wiring interconnect test; 1149.1; Board Test; Boundary Scan; JTAG; Wire Interconnect; hysteresis; shorts;
Conference_Titel :
Test Conference (ITC), 2010 IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-7206-2
DOI :
10.1109/TEST.2010.5699259
