DocumentCode
2309474
Title
Surviving state disruptions caused by test: The “Lobotomy Problem”
Author
Parker, Kenneth P.
Author_Institution
Agilent Technol., Loveland, CO, USA
fYear
2010
fDate
2-4 Nov. 2010
Firstpage
1
Lastpage
8
Abstract
The practice of initializing a board or system for testing purposes is not an exact science, but rather, pursued empirically and with little help from IC designers. This paper examines some of the issues and trends that justify adding features to IEEE 1149.1 that will facilitate safe, fast and effective initialization of a board or system, to get it ready for testing and to leave it in a safe state upon completion of testing.
Keywords
integrated circuit testing; IC designers; IEEE 1149.1; lobotomy problem; state disruptions; testing purposes;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference (ITC), 2010 IEEE International
Conference_Location
Austin, TX
ISSN
1089-3539
Print_ISBN
978-1-4244-7206-2
Type
conf
DOI
10.1109/TEST.2010.5699260
Filename
5699260
Link To Document