• DocumentCode
    2309537
  • Title

    Lattice-mismatched In0.40Al0.60As window layers for indium phosphide solar cells

  • Author

    Jain, R.K. ; Landis, G.A. ; Wilt, D.M. ; Flood, D.J.

  • Author_Institution
    NASA Lewis Res. Center, Cleveland, OH, USA
  • fYear
    1993
  • fDate
    10-14 May 1993
  • Firstpage
    757
  • Lastpage
    762
  • Abstract
    The efficiency of indium phosphide solar cells is limited by the high surface recombination velocity (~107 cm/s). This might be reduced by a wide-bandgap window layer. In this work the authors calculate the performance of InP solar cells with wide-bandgap (1.8 eV) lattice-mismatched In0.40Al0.60As as a window layer. As the required window layer is less than the critical layer thickness, growth of strained (pseudomorphic) layers without interfacial misfit dislocations should be possible. Calculations using the PC-lD numerical code have shown that the efficiencies of baseline and optimized p+n cells are increased to more than 22% and 24% (AM0, 25°C) respectively for In0.04Al0.60As window layer of 10 nm thickness. Comparatively little improvement is found for n+p cells
  • Keywords
    III-V semiconductors; aluminium compounds; electron-hole recombination; energy gap; indium compounds; power engineering computing; semiconductor device models; solar cells; 10 nm; 22 to 24 percent; 25 C; InAlAs; InP; InP solar cells; PC-lD numerical code; indium phosphide solar cells; interfacial misfit dislocations; lattice-mismatched In0.40Al0.60As window layers; n+p cells; optimized p+n cells; p+n cells; pseudomorphic layers growth; strained layers growth; wide-bandgap window layer; Electrons; Gallium arsenide; Indium phosphide; Lattices; NASA; Photonic band gap; Photovoltaic cells; Protons; Space technology; Surface resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1993., Conference Record of the Twenty Third IEEE
  • Conference_Location
    Louisville, KY
  • Print_ISBN
    0-7803-1220-1
  • Type

    conf

  • DOI
    10.1109/PVSC.1993.346995
  • Filename
    346995