DocumentCode :
2309812
Title :
Integration for innovation—Trends in test and Moore´s Law
Author :
Truchard, James
Author_Institution :
CEO and Co-founder, National Instruments, USA
fYear :
2010
fDate :
2-4 Nov. 2010
Firstpage :
12
Lastpage :
12
Abstract :
Everyone is familiar with Moore´s Law, but have you taken time to think through the impact it should have on test instrumentation? The transistor has decreased in size by a factor of 2000, so why hasn´t your tester followed suit? There are many high-performance commercial technologies available to you today to help improve how effi ciently you test. Multicore processing, PCI Express, and FPGAs are all under-utilized in today´s test systems, and can increase the performance and lower the cost of automated test.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference (ITC), 2010 IEEE International
Conference_Location :
Austin, TX, USA
ISSN :
1089-3539
Print_ISBN :
978-1-4244-7206-2
Type :
conf
DOI :
10.1109/TEST.2010.5699285
Filename :
5699285
Link To Document :
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