Title :
Integration for innovation—Trends in test and Moore´s Law
Author_Institution :
CEO and Co-founder, National Instruments, USA
Abstract :
Everyone is familiar with Moore´s Law, but have you taken time to think through the impact it should have on test instrumentation? The transistor has decreased in size by a factor of 2000, so why hasn´t your tester followed suit? There are many high-performance commercial technologies available to you today to help improve how effi ciently you test. Multicore processing, PCI Express, and FPGAs are all under-utilized in today´s test systems, and can increase the performance and lower the cost of automated test.
Conference_Titel :
Test Conference (ITC), 2010 IEEE International
Conference_Location :
Austin, TX, USA
Print_ISBN :
978-1-4244-7206-2
DOI :
10.1109/TEST.2010.5699285