• DocumentCode
    2309818
  • Title

    Large area GaInP2/GaAs tandem cell development for space power systems

  • Author

    Chiang, P.K. ; Vijayakumar, P.S. ; Cavicchi, B.T.

  • Author_Institution
    Spectrolab Inc., Sylmar, CA, USA
  • fYear
    1993
  • fDate
    10-14 May 1993
  • Firstpage
    659
  • Lastpage
    664
  • Abstract
    The authors report the successful fabrication of single junction GaInP2 cells with an excellent uniformity in cell performance across 2" wafers. An average efficiency of 15.1% (with the best cell efficiency at 15.3%) under 1 sun AM0 illumination have been demonstrated on total tested areas of more than 15 cm2. They also report electron radiation experiment results using 0.7, 1.0 and 2.0 MeV energies at fluences as high as 1×1016 cm-2. The results indicate excellent resistance in GaInP2 cells. The damage coefficients of GaInP2 single junction cell deduced from this experiment, have been used to further refine the prediction for the performance of the tandem cell. The results indicate that the GaInP2/GaAs tandem cell is capable of producing a minimum average cell efficiency over 25% (AM0, 28°C) at the beginning-of-life (BOL) with more than 82% remaining power after 1×1015 cm-2, 1 MeV electron irradiation
  • Keywords
    III-V semiconductors; electron beam effects; gallium arsenide; gallium compounds; indium compounds; photovoltaic power systems; semiconductor device testing; solar cells; space vehicle power plants; 1 sun AM0 illumination; 15.1 to 15.3 percent; 25 percent; 28 C; GaInP2-GaAs; GaInP2GaAs tandem solar cell; electron radiation experiment; fabrication; single junction GaInP2 cells; space power systems; Electrons; Gallium arsenide; Lattices; Lighting; MOCVD; Power systems; Space technology; Sun; Surface morphology; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1993., Conference Record of the Twenty Third IEEE
  • Conference_Location
    Louisville, KY
  • Print_ISBN
    0-7803-1220-1
  • Type

    conf

  • DOI
    10.1109/PVSC.1993.347014
  • Filename
    347014