Title :
Concurrent test supported by DFT techniques and ATE companies
Abstract :
Concurrent Test needs support by DFT and ATE. A lot of devices are suitable for concurrent test, but what about ATE hardware and software? Do they support concurrent test adequately? What are the different philosophies in DFT and ATE hardware and software?
Conference_Titel :
Test Conference (ITC), 2010 IEEE International
Conference_Location :
Austin, TX, USA
Print_ISBN :
978-1-4244-7206-2
DOI :
10.1109/TEST.2010.5699291
