DocumentCode
2309970
Title
A MEMS based device interface board
Author
Kandalaft, N. ; Basith, I. ; Rashidzadeh, R.
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Windsor, Windsor, ON, Canada
fYear
2010
fDate
2-4 Nov. 2010
Firstpage
1
Lastpage
1
Abstract
At gigahertz frequency range, performance degradation of the device interface board increases the yield loss and the cost of manufacturing. In this poster a MEMS based solution is proposed to design a Device Interface Board (DIB) supporting high-speed connectivity between the device under test and the tester. Simulation results indicate that the proposed scheme can operate up to 50 GHz without considerable signal integrity degradation.
Keywords
micromechanical devices; MEMS based device interface board; MEMS based solution; gigahertz frequency range; high speed connectivity; performance degradation; signal integrity degradation;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference (ITC), 2010 IEEE International
Conference_Location
Austin, TX
ISSN
1089-3539
Print_ISBN
978-1-4244-7206-2
Type
conf
DOI
10.1109/TEST.2010.5699296
Filename
5699296
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