• DocumentCode
    2309970
  • Title

    A MEMS based device interface board

  • Author

    Kandalaft, N. ; Basith, I. ; Rashidzadeh, R.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Windsor, Windsor, ON, Canada
  • fYear
    2010
  • fDate
    2-4 Nov. 2010
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    At gigahertz frequency range, performance degradation of the device interface board increases the yield loss and the cost of manufacturing. In this poster a MEMS based solution is proposed to design a Device Interface Board (DIB) supporting high-speed connectivity between the device under test and the tester. Simulation results indicate that the proposed scheme can operate up to 50 GHz without considerable signal integrity degradation.
  • Keywords
    micromechanical devices; MEMS based device interface board; MEMS based solution; gigahertz frequency range; high speed connectivity; performance degradation; signal integrity degradation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference (ITC), 2010 IEEE International
  • Conference_Location
    Austin, TX
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-7206-2
  • Type

    conf

  • DOI
    10.1109/TEST.2010.5699296
  • Filename
    5699296