Title :
Is test power reduction through X-filling good enough?
Author :
Wu, F. ; Dilillo, L. ; Bosio, A. ; Girard, P. ; Pravossoudovitch, S. ; Virazel, A. ; Tehranipoor, M. ; Miyase, K. ; Wen, X. ; Ahmed, N.
Author_Institution :
LIRMM, Univ. Montpellier 2, Montpellier, France
Abstract :
This study investigates the reasons why test power reduction through X-filling techniques works well for cycle-average power reduction but is not so efficient concerning instantaneous peak power reduction.
Keywords :
automatic test pattern generation; boundary scan testing; X-filling techniques; cycle-average power reduction; instantaneous peak power reduction; test power reduction;
Conference_Titel :
Test Conference (ITC), 2010 IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-7206-2
DOI :
10.1109/TEST.2010.5699297
