• DocumentCode
    2309978
  • Title

    Is test power reduction through X-filling good enough?

  • Author

    Wu, F. ; Dilillo, L. ; Bosio, A. ; Girard, P. ; Pravossoudovitch, S. ; Virazel, A. ; Tehranipoor, M. ; Miyase, K. ; Wen, X. ; Ahmed, N.

  • Author_Institution
    LIRMM, Univ. Montpellier 2, Montpellier, France
  • fYear
    2010
  • fDate
    2-4 Nov. 2010
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    This study investigates the reasons why test power reduction through X-filling techniques works well for cycle-average power reduction but is not so efficient concerning instantaneous peak power reduction.
  • Keywords
    automatic test pattern generation; boundary scan testing; X-filling techniques; cycle-average power reduction; instantaneous peak power reduction; test power reduction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference (ITC), 2010 IEEE International
  • Conference_Location
    Austin, TX
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-7206-2
  • Type

    conf

  • DOI
    10.1109/TEST.2010.5699297
  • Filename
    5699297
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2309978