Title :
Using context based methods for test data compression
Author :
Karamati, Sara ; Navabi, Zainalabedin
Author_Institution :
Electr. & Comput. Eng. Dept., Univ. of Tehran, Tehran, Iran
Abstract :
This paper proposes a new test data compression method based on a context based binary arithmetic coding. The proposed method is suitable for fully specified test vector, benefiting from elimination of the relaxation step used in former methods. This method is evaluated using ISCAS89 full scan circuits.
Keywords :
arithmetic codes; automatic test pattern generation; binary codes; boundary scan testing; ISCAS89 full scan circuits; context based binary arithmetic coding; context based methods; fully specified test vector; relaxation step; test data compression method;
Conference_Titel :
Test Conference (ITC), 2010 IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-7206-2
DOI :
10.1109/TEST.2010.5699301
