Title :
Detecting and diagnosing open defects
Author :
Tran, Dat ; Winemberg, LeRoy ; Carder, Darrell ; Lin, Xijiang ; LeBritton, Joe ; Swanson, Bruce
Author_Institution :
Freescale Semicond., Austin, TX, USA
Abstract :
One of the common failures found in manufactured ICs are interconnect opens. While stuck-at and transition fault automatic test pattern generation (ATPG) patterns can detect open defects, these fault models do not catch all of them. This poster describes a project and research with a new open fault model to supplement the others. The project consists of many parts that target specific types of known open defects.
Keywords :
automatic test pattern generation; fault diagnosis; integrated circuit testing; open defect detection; open defect diagnosis; open fault model;
Conference_Titel :
Test Conference (ITC), 2010 IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-7206-2
DOI :
10.1109/TEST.2010.5699303
