DocumentCode :
2310569
Title :
Optical confinement in thin silicon films: a comprehensive ray optical theory
Author :
Sopori, Bhushan L. ; Marshall, Todd
Author_Institution :
Nat. Renewable Energy Lab., Golden, CO, USA
fYear :
1993
fDate :
10-14 May 1993
Firstpage :
127
Lastpage :
132
Abstract :
This paper describes a ray-optics theory to analyze optical confinement in silicon solar cells using random or periodically rough surfaces. This theory considers multireflections within the cell. It also takes into account polarization and interference effects to include antireflection coatings and local nonnormal incidence of light. The results are given in terms of parameters such as reflectance, transmittance, and absorbance for global AM1.5 illumination. A variety of thin-film structures, suitable for light trapping, are compared in terms of the maximum achievable current densities. The paper emphasizes optical concepts that are necessary to design thin-film solar cells using nonplanar interfaces
Keywords :
antireflection coatings; current density; elemental semiconductors; light interference; light polarisation; light reflection; optical design techniques; ray tracing; semiconductor device models; semiconductor thin films; silicon; solar cells; Si; absorbance; antireflection coatings; current densities; design; global illumination; interference; light trapping; multireflections; nonplanar interfaces; optical confinement; polarization; ray optical theory; reflectance; rough surfaces; thin-film solar cells; transmittance; Coatings; Interference; Optical films; Optical polarization; Photovoltaic cells; Reflectivity; Rough surfaces; Semiconductor films; Silicon; Surface roughness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 1993., Conference Record of the Twenty Third IEEE
Conference_Location :
Louisville, KY
Print_ISBN :
0-7803-1220-1
Type :
conf
DOI :
10.1109/PVSC.1993.347066
Filename :
347066
Link To Document :
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