Approximate analytical modeling of current crowding effects in multi-turn spiral inductors

Author

Kuhn, W.B. ; Ibrahim, N.M.

Author_Institution

Dept. of Electr. & Comput. Eng., Kansas State Univ., Manhattan, KS, USA

Volume

1

fYear

2000

fDate

11-16 June 2000

Firstpage

405

Abstract

The effective series resistance of a multi-turn spiral inductor operating at high frequencies is known to increase dramatically above its DC value due to proximity-effect or current crowding. This phenomenon is difficult to analyze precisely and has generally required electromagnetic simulation for quantitative assessment. Current crowding is studied in this work through approximate analytical modeling and first order expressions are derived for predicting resistance as a function of frequency. The results are validated through electromagnetic simulation and with measured data taken from a spiral inductor implemented in a silicon-on-sapphire process.

Keywords

MMIC; UHF integrated circuits; circuit simulation; inductors; integrated circuit modelling; lumped parameter networks; approximate analytical modeling; current crowding effects; effective series resistance; electromagnetic simulation; first order expressions; multi-turn spiral inductors; proximity-effect; silicon-on-sapphire process; Analytical models; Electrical resistance measurement; Electromagnetic analysis; Electromagnetic induction; Electromagnetic measurements; Frequency; Inductors; Predictive models; Proximity effect; Spirals;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium Digest. 2000 IEEE MTT-S International

Conference_Location

Boston, MA, USA

ISSN

0149-645X

Print_ISBN

0-7803-5687-X

Type

conf

DOI

10.1109/MWSYM.2000.861041

Filename

861041