DocumentCode
2310840
Title
Arrays to atoms: the evolution of characterization
Author
Kazmerski, Lawrence L.
Author_Institution
Nat. Renewable Energy Lab., Golden, CO, USA
fYear
1993
fDate
10-14 May 1993
Firstpage
1
Lastpage
7
Abstract
Characterization is one important component of the photovoltaics research and development effort. It has supported the evolution of the technology, and measurement techniques have evolved in response to the technology´s needs. This paper highlights some important evaluation and verification techniques, covering macroscale through microscale characterization methods. Some emphasis is placed upon the nanoscale regime, in which the characterization and processing of semiconductors is leading to areas of atomic engineering of materials
Keywords
nanotechnology; solar cells; atomic engineering; evaluation techniques; macroscale characterization; measurement techniques; microscale characterization; nanoscale regime; photovoltaics research; semiconductors processing; verification techniques; Atomic measurements; Capacitance measurement; Current measurement; Electron beams; Energy measurement; Force measurement; Loss measurement; Mass spectroscopy; Photovoltaic cells; Pulse measurements;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference, 1993., Conference Record of the Twenty Third IEEE
Conference_Location
Louisville, KY
Print_ISBN
0-7803-1220-1
Type
conf
DOI
10.1109/PVSC.1993.347087
Filename
347087
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