• DocumentCode
    2310864
  • Title

    Study on internal water vapor content and related military standards of hermetic package devices

  • Author

    Yu, Shao-Hua ; Gao, Cheng ; Wang, Xiang-Fen

  • Author_Institution
    Dept. of Reliability & Syst. Eng., Beijing Univ. of Aeronaut. & Astronaut., Beijing, China
  • fYear
    2010
  • fDate
    20-22 Oct. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Water vapor is one of the most important contaminants which caused devices failure. Internal water vapor content of hermetic package devices is closely related to the sealing performance, water absorption substances inside the package, leak plugging and other factors. The main mechanisms of leak plugging and water absorption by moisture absorbing substances are theoretically analyzed in this paper. Considering the harmfulness that result from the water absorption substances releasing moisture at high temperature, a simplified model is proposed, which is used to describe the internal water vapor content of a package with moisture absorbing substances. At last, this paper performs a study on related seal failure criterion in military standards by using two modes under different instances. A conclusion about the seal failure criterion in military standards is made when helium mass spectrometer leak detection method is used to detect the leak rate.
  • Keywords
    failure analysis; hermetic seals; leak detection; mass spectrometers; military standards; moisture; water; device failure; helium mass spectrometer leak detection method; hermetic package device; internal water vapor content; leak plugging; leak rate detection; military standards; moisture absorbing substance; seal failure; water absorption substance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems Packaging Assembly and Circuits Technology Conference (IMPACT), 2010 5th International
  • Conference_Location
    Taipei
  • ISSN
    2150-5934
  • Print_ISBN
    978-1-4244-9783-6
  • Electronic_ISBN
    2150-5934
  • Type

    conf

  • DOI
    10.1109/IMPACT.2010.5699471
  • Filename
    5699471