DocumentCode :
2310952
Title :
An easily testable parallel multiplier
Author :
Hong, S.J.
Author_Institution :
General Electric Co., Schenectady, NY, USA
fYear :
1988
fDate :
27-30 June 1988
Firstpage :
214
Lastpage :
219
Abstract :
The n-by-n parallel multiplier can be usually broken into two blocks, the summand-generator and the summand-counter. The summand-generator generates n/sup 2/ summands and the summand-counter adds them up to produce the final 2n-bit product. The summand-generator is easy to test because all inputs are directly controllable and all faults propagate through summand-counter to primary outputs. However, the summand-counter is difficult to test due to poor controllability. To provide 100% controllability of summands, the summand-generator is modified using one extra input. This new summand-generator can be tested with 19 vectors. With this summand-generator, the summand-counter can be constructed testable using the minimum number of adder cells but no extra device or pin. This summand-counter can be tested with 3n+41 vectors. Thus, a parallel multiplier can be designed testable with 3n+60 vectors using only one extra pin.<>
Keywords :
logic design; logic testing; multiplying circuits; parallel processing; adder cells; easily testable parallel multiplier; summand-counter; summand-generator; Adders; Circuit faults; Circuit testing; Controllability; Counting circuits; Design for testability; Equations; Hardware; Pins; Research and development;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Fault-Tolerant Computing, 1988. FTCS-18, Digest of Papers., Eighteenth International Symposium on
Conference_Location :
Tokyo, Japan
Print_ISBN :
0-8186-0867-6
Type :
conf
DOI :
10.1109/FTCS.1988.5322
Filename :
5322
Link To Document :
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