• DocumentCode
    2310983
  • Title

    The saturation behaviour of metastable defect creation in a-Ge:H investigated by keV-electron irradiation

  • Author

    Scholz, A. ; Schroder, B. ; Oechsner, H.

  • Author_Institution
    Dept. of Phys., Kaiserslautern Univ., Germany
  • fYear
    1993
  • fDate
    10-14 May 1993
  • Firstpage
    907
  • Lastpage
    912
  • Abstract
    We report on the stability of differently prepared high quality a-Ge:H using keV-electron irradiation as a fast and strong degradation technique for the creation of metastable defects. The influence of film properties on the saturation defect density is carefully studied and a chemical equilibrium model developed for a-Si:H is successfully applied to a-Ge:H. This allows to calculate the saturation defect density of a-Ge:H from its initial film properties. Analysing the chemical equilibrium the influence of specific parameters like hydrogen content and Urbach energy on the saturation defect density after keV-electron irradiation is examined and proposals for the improvement of the stability of a-Ge:H against metastable defect creation are made and experimentally confirmed. The experiments reveal no indication for a principally different stability behaviour of a-Ge:H compared to a-Si:H
  • Keywords
    amorphous semiconductors; chemical equilibrium; electron beam effects; elemental semiconductors; germanium; hydrogen; Ge:H; H content; Si:H; Urbach energy; a-Ge:H; a-Si:H; chemical equilibrium model; degradation technique; film properties; keV-electron irradiation; metastable defect creation; metastable defects; saturation behaviour; saturation defect density; stability; Absorption; Chemical analysis; Degradation; Electrons; Germanium; Hydrogen; Metastasis; Optical films; Photovoltaic cells; Stability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1993., Conference Record of the Twenty Third IEEE
  • Conference_Location
    Louisville, KY
  • Print_ISBN
    0-7803-1220-1
  • Type

    conf

  • DOI
    10.1109/PVSC.1993.347100
  • Filename
    347100