DocumentCode :
2311016
Title :
A new tool for multijunction cell diagnostics-QE measurements under AM1 bias light
Author :
Hou, Jingya ; Fonash, S.J. ; Chen, Liangfan
Author_Institution :
Electron. Mater. & Processing Res. Lab., Pennsylvania State Univ., University Park, PA, USA
fYear :
1993
fDate :
10-14 May 1993
Firstpage :
891
Lastpage :
895
Abstract :
The authors attempt to obtain a relatively simple diagnostic tool that can be used to optimize the efficiency of multijunction solar cells. This measurement should be able to pinpoint which sub-cell most needs improvement. In this report, they explore such a tool: the quantum efficiency at the maximum power point under AM1 light (AM1QE). They demonstrate the application of AM1QE-based guidelines with AMPS computer program simulations and show that the most substantial improvement from sub-cell thickness adjustments comes from the sub-cell which causes a peak in the AM1QE. They also show that this proposed AM1QE quantum efficiency measurement for multijunctions is a much more sensitive monitor of changes in a multijunction than the so-called color light bias quantum efficiency measurement
Keywords :
digital simulation; electronic engineering computing; p-n heterojunctions; power engineering computing; semiconductor device models; semiconductor device testing; software packages; solar cells; AM1 light; AM1QE; AMPS; computer program; diagnostic tool; efficiency; guidelines; maximum power point; measurement; multijunction solar cells; optimisation; quantum efficiency; simulation; sub-cell thickness; Color; Current measurement; Electric variables measurement; Identity-based encryption; Monitoring; Power conversion; Power measurement; Shape; Thickness measurement; Wavelength measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 1993., Conference Record of the Twenty Third IEEE
Conference_Location :
Louisville, KY
Print_ISBN :
0-7803-1220-1
Type :
conf
DOI :
10.1109/PVSC.1993.347103
Filename :
347103
Link To Document :
بازگشت