DocumentCode
2311046
Title
Amorphous silicon solar cells with graded low-level doped i-layers characterised by bifacial measurements
Author
Fischer, D. ; Wyrsch, N. ; Fortmann, C.M. ; Shah, A.V.
Author_Institution
Inst. of Microtechnol., Neuchatel Univ., Switzerland
fYear
1993
fDate
10-14 May 1993
Firstpage
878
Lastpage
884
Abstract
Bifacial spectral response characterization of solar cells under near operating condition illumination is used in conjuncture with a novel bifacial DICE analysis to establish the collection efficiency as a function of i-layer position in p-i-n amorphous silicon solar cells. A significant portion of solar cell degradation can be explained in terms of electric field distortions which increase recombination losses. Unlike carrier lifetime reductions, the field distortions can be reduced. The numerical model is used to guide the intentional doping of the i-layer to counteract the field distortions caused by charged dangling bonds, and thus to optimize the electric field for the degraded state. Solar cells with graded low-level boron doping in the i-layer are analysed in detail. Increasing conversion efficiency during light-soaking, and enhanced stabilized n-side performance show the viability of the electric field optimization
Keywords
amorphous semiconductors; boron; electric fields; electron-hole recombination; elemental semiconductors; semiconductor device models; semiconductor device testing; semiconductor doping; silicon; solar cells; Si:B; a-Si solar cells; bifacial DICE analysis; bifacial spectral response characterization; charged dangling bonds; conversion efficiency; degradation; doping; electric field distortions; graded low-level doped i-layers; light soaking; numerical model; optimization; p-i-n; performance; recombination losses; semiconductor; stability; Ambient intelligence; Amorphous silicon; Annealing; Degradation; Doping; Filters; Lighting; PIN photodiodes; Photovoltaic cells; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference, 1993., Conference Record of the Twenty Third IEEE
Conference_Location
Louisville, KY
Print_ISBN
0-7803-1220-1
Type
conf
DOI
10.1109/PVSC.1993.347105
Filename
347105
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