• DocumentCode
    2311100
  • Title

    DOE — QFD — SPC — FMEA…‥ CDT?

  • Author

    Rankine, John

  • fYear
    2010
  • fDate
    20-22 Oct. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The PCB business is constrained on every side. On one side, material suppliers have price pressures that reflect increasing raw material and energy costs. On the other side, equipment manufacturers and assemblers are being driven by tighter market prices. In this squeeze, the PCB manufacturer has little scope in price manipulation or product changes. The answer therefore lies in improving yield. Yield improvement offers major opportunities for the PCB manufacturer to increase profit through increasing overall efficiency and reducing waste without changing input costs or increasing prices. To make pressure more intense, the industry is being driven to ever smaller and tighter geometries and higher tracking densities. As feature sizes reduce, the opportunities for defects increase. The requirement is to continually drive down the risk factors. This means a new approach to process management and techniques and relationships such as DOE (Design of Experiment), QFD (Quality Function Deployment), SPC (Statistical Process Control) and FMEA (Failure Mode Effect Analysis) are now the essential vernacular of our industry. There is one more abbreviation we want to add to this list CDT an acronym for crucial steps in yield improvement, the meaning and the value will soon become clear.
  • Keywords
    assembling; design of experiments; failure analysis; hygiene; printed circuit manufacture; quality function deployment; raw materials; statistical process control; training; PCB manufacturer; cleanliness; design of experiment; discipline; energy costs; equipment assemblers; equipment manufacturers; failure mode effect analysis; material supplier; price manipulation; process management; quality function deployment; raw material; statistical process control; training; yield improvement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems Packaging Assembly and Circuits Technology Conference (IMPACT), 2010 5th International
  • Conference_Location
    Taipei
  • ISSN
    2150-5934
  • Print_ISBN
    978-1-4244-9783-6
  • Electronic_ISBN
    2150-5934
  • Type

    conf

  • DOI
    10.1109/IMPACT.2010.5699487
  • Filename
    5699487