DocumentCode :
2311323
Title :
Interferometric Measurements of Piezoelectrically Driven Actuators
Author :
Jozwik, Michal ; Kacperski, Jacek ; Kujawinska, Malgorzata ; Gorecki, Christophe
Author_Institution :
Inst. of Micromech. & Photonics, Warsaw Univ. of Technol.
fYear :
2006
fDate :
June 30 2006-July 2 2006
Firstpage :
24
Lastpage :
25
Abstract :
The ability to experimentally characterize static and dynamic deformation effects is crucial to the development of actuated MEMS and MOEMS devices. Almost all technological processes have an influence on the flatness and initial shape of microstructures. The accurate metrology plays a key role in the characterization and control of critical micro machining processes. For testing of MEMS structures the interferometric platform has been proposed. It gives the possibility to combine the capabilities of interferometric methods to measure static (e.g., initial shape, static out-of-plan displacements) and dynamic parameters of samples (e.g., resonance frequencies and amplitude distributions in vibration modes). In static case we use the conventional interferometry, while for vibrating elements the stroboscopic interferometry is applied with additional reference wavefront correction by a spatial modulator, namely liquid crystal on silicon (LCOS) element. As an exemplary results, the measurement of piezoelectrically driven silicon microactuators are presented
Keywords :
deformation; electro-optical modulation; light interferometry; liquid crystal on silicon; micro-optomechanical devices; microactuators; micromachining; optical testing; piezoelectric actuators; spatial light modulators; stroboscopes; vibrations; MEMS structure testing; MOEMS devices; actuated MEMS; amplitude distributions; dynamic deformation effects; interferometric measurements; liquid crystal on silicon element; micromachining process control; microstructure shape; piezoelectrically driven silicon microactuators; resonance frequencies; spatial modulator; static characterization; stroboscopic interferometry; vibration modes; wavefront correction; Interferometry; Liquid crystal on silicon; Machining; Metrology; Micromechanical devices; Microstructure; Piezoelectric actuators; Shape measurement; Testing; Vibration measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photonics and Microsystems, 2006 International Students and Young Scientists Workshop
Conference_Location :
Wroclaw
Print_ISBN :
1-4244-0392-8
Electronic_ISBN :
1-4244-0393-6
Type :
conf
DOI :
10.1109/STYSW.2006.343662
Filename :
4149601
Link To Document :
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