DocumentCode :
2311514
Title :
Comparison of FDTD excitation models for scatterometry of periodic reticles
Author :
Salski, B. ; Gwarek, W.K. ; Celuch, M.
Author_Institution :
QWED Sp. z o.o., Warsaw
fYear :
2007
fDate :
9-15 June 2007
Firstpage :
1673
Lastpage :
1676
Abstract :
Complex looped FDTD algorithms originally proposed for periodic waveguiding structures are adapted for scatterometry applications. To this end, two mechanisms of launching the plane wave illumination and extracting the scattering parameters are proposed. The first one is based on a classical connecting surface, imposed however on both real and imaginary FDTD grids to generate a single propagating plane wave. It is operated jointly with the near-to-far transformation in the frequency domain. The other mechanism uses the concept of waveguide mode templates and S-parameter extraction procedures borrowed from microwave circuit analysis. Results from both techniques are mutually consistent, and have also been validated against the rigorous coupled wave analysis for simplified scenarios. Both techniques may be implemented into other periodic FDTD formulations.
Keywords :
S-parameters; electromagnetic wave scattering; finite difference time-domain analysis; flaw detection; integrated circuit packaging; S-parameter extraction; complex looped FDTD algorithms; integrated circuit packages defectoscopy; periodic reticles scatterometry; plane wave; scattering parameters; Finite difference methods; Joining processes; Lighting; Mesh generation; Microwave propagation; Periodic structures; Radar measurements; Scattering parameters; Surface waves; Time domain analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium, 2007 IEEE
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-0877-1
Electronic_ISBN :
978-1-4244-0878-8
Type :
conf
DOI :
10.1109/APS.2007.4395834
Filename :
4395834
Link To Document :
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